2012

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Author Instructions

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Abstract Preparation

Prospective authors should submit an extended abstract of 3 to 4 pages in length, including figures, tables and references. Shorter submissions may be automatically rejected. The extended abstract should summarize the scope of the paper and the primary results and findings, emphasizing new advances, theories and/or applications so that the program committee will be able to understand the originality and the value of the work.

For your convenience, the Style Manual and Conference Paper templates in various formats are available through the following links:

Style Manual

Paper Templates

Accepted Papers will be included in the IEEE Xplore digital library and indexed by EI/Compendex.

DEADLINES

Extended Abstract Submission:  2012
Acceptance Notification:  2012
Final Manuscript Submission:  2012

Author Registration

Each lead author must visit the EDAS web site and establish an account with a username and password. The lead author then logs in to the EDAS system to actually submit the abstract, and later, the paper via the following steps:

  1. Visit www.edas.info and click the New User button.
  2. Create your profile. Only the five fields with the red asterisk are required. These fields are first & last name, affiliation (company or organization), country, e-mail address, and status. When the fields are filled in, check the Privacy Policies box and click the Add Person button.
    [note: if you select USA as the country, you will get a message asking for your state]
  3. You will receive an e-mail containing your password. Your email address and the given password must later be used to access the system during the following steps, so be careful to remember it.
  4. You can then return to the EDAS log-in page (http://www.edas.info) and change your assigned password to one that is easier to remember. To do this, click on the My Profile tab, and then click on change your password. Be sure to record your user name, password and ID number for later reference.

Submission of Extended Abstract

Please login at  http://edas.info/ and follow the following steps:

  1. Type in the title of the paper in the block and give a five line description of your paper. Then select the topic area(s) your paper falls under best.
    [note: This will help in choosing the reviewers. The abstract will be uploaded later]
  2. Click the Submit button.
  3. The next page you see will have a large green check mark and a statement that the paper was registered. The last row says Manuscript, and has an icon of a yellow folder next to it. Click on this icon, and then you can upload your manuscripton the next page. Manuscript is used to refer to the PDF form of your extended abstract. You can also upload the paper by clicking the My Papers tab at the top of the screen, and then select the upload icon on the same row as the name of your paper. The upload icon (third column from the right) will open a dialog box that will enable you to select and upload the abstract file via the web or via FTP.
  4. Problems in preparing and submitting your extended abstract? Further Information?

    Contact the ISICT Administrator:
    Chris Dyer
    Conference Catalysts, LLC

Call for Papers

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2012 ICIST Call for Papers

Organizers

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Information coming soon.

Welcome to ISICT 2012

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The 8th IEEE International Symposium on Instrumentation and Control Technology

ISICT 2012 will be held at the University of Westminster in London, United Kingdom, 11-13 July 2012.

The 8th IEEE International Symposium on Instrumentation and Control Technology (ISICT 2012) provides an established forum for scientists and engineers on the field of Instrumentation and Control Technology to meet and exchange information about novel and emergent development, applications in Measurement, Sensors, Instrumentation and Control Technology areas.

Building upon the success of the 1st-7th ISICT series conferences over the last decade, The 8th IEEE International Symposium on Instrumentation and Control Technology will take place in city of London, the first city to officially host the modern Olympic Games three times. Like the celebration of the Olympic Games encompasses many rituals and symbols, the ISICT 2012 shall continue the tradition of bringing together top specialists in the broad area of Measurement, Sensors, Instrumentation, Computer Control Technology and allow participants from all over the world to celebrate and enjoy the incomparable platform for knowledge mining, idea exchanging and collaboration discussing. 

A special issue in the international journal MEASUREMENT will be published after the conference to cover high level contributions provided the authors extend their content presented at the conference. It should be noted that one author of the paper to be submitted to the special issue must present their work in the conference, and all papers will be peer-reviewed.

All submitted papers to ISICT 2012 will be thoroughly reviewed for possible inclusion in the Conference Proceedings. Proceedings of the symposium will be published by IEEE and indexed by EI.  Papers are invited in English only, including but not limited to the following related topics:

•    Sensors and Instruments
MEMS Sensors
Nanosensors and Instruments
Biosensors/Arrays
Smart sensors and standards (IEEE 1451.X)
Virtual sensors and Instruments

•    Signal Acquisition, Analysis and Processing
Data Acquisition
Data mining and fusion
Digital Signal Processing
Machine Vision and related

•    Measurement Theory and Technology
Uncertainty Theories and Applications
Industrial Measurement
Electronic/Biological/Medical Measurement Techniques
On-line Monitoring of Dynamic Processes

•    Opto-electronics Technology and Instruments
Opto-Electronic Testing
Opto-Electronic Instruments
Modern Optical Instruments
Fiber-Optical Sensors and Technology

•    Measurement Systems
Automated test & diagnostics systems
Fault-tolerant & resilient measurement systems
Machine Vision
Virtual measurement systems
Bus, Network and Reliability

•    Control Theory and Automation
Control Theories and Application
Intelligent and Fault Tolerance Control
Integration Technologies of Automatic Test System
Industrial Automation
Decision-making Robot Control

•    Computer Simulation, Modeling
Modeling & Simulation Technology
Inverse problems & signal reconstruction
Signal detection & classification
Hardware and Software in Simulation
Knowledge Acquisition and Expression

•    Artificial Intelligence and Expert System
Robot
System Supervision and Maintenance
Intelligent Systems
Soft computing and Software Applications
Pattern Recognition and Identification

•    Space Exploration
Remote sensing and telemetry
Advanced Navigation Technologies
Inertial instruments
Space Robotics
In-situ measurement
Control of Spacecraft